Wen's Research Group
Wen Zhang, Ph.D., P.E., BCEE
Principal Investigator
Professor
Phone: (973) 596-5520
Fax: (973) 596-5790
Email: wen.zhang@njit.edu
Office Location: Colton Hall 211
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Major analytical instruments in environmental engineering labs
HPLC, GC-FID, GC-ECD, Fluorescent spectrometry, UV-vis spectrometry, dynamic light scattering (DLS) and nanoparticle tracking analysis (NTA) for particle size and zeta potential measurement, UV lamp and irradiation, Xenon lamp and irradiation, vacuum furnace, Muffle furnace, vacuum dryer, weighing balance, peristaltic pumps, ultra-high speed centrifuge, clean UV-irradiated bench, autoclave, jar tests platforms, electrochemistry platforms, optical microscopes with large screen monitors and image/video recorder, multiple water sensors (pH, redox potential, temperature, DO, salinity, conductivity, etc.), Millipore deionized water, rotational shakers iso temperature water bath, ultrasonicator, 96-cell microplate reader, quartz crystal microbalance (QCM).
HPLC, GC-FID, GC-ECD, Fluorescent spectrometry, UV-vis spectrometry, dynamic light scattering (DLS) and nanoparticle tracking analysis (NTA) for particle size and zeta potential measurement, UV lamp and irradiation, Xenon lamp and irradiation, vacuum furnace, Muffle furnace, vacuum dryer, weighing balance, peristaltic pumps, ultra-high speed centrifuge, clean UV-irradiated bench, autoclave, jar tests platforms, electrochemistry platforms, optical microscopes with large screen monitors and image/video recorder, multiple water sensors (pH, redox potential, temperature, DO, salinity, conductivity, etc.), Millipore deionized water, rotational shakers iso temperature water bath, ultrasonicator, 96-cell microplate reader, quartz crystal microbalance (QCM).
Powder XRD provides detailed information on the crystallographic structure and physical properties of materials and thin films.The sample is irradiated with a beam of monochromatic x-rays over a variable incident angle range. Interaction with atoms in the sample results in diffracted x-rays when the Bragg equation is satisfied. Resulting spectra are characteristic of chemical composition and phase. The technique uniquely provides phase identification (e.g. graphite or diamond), along with phase quantification, % crystallinity, crystallite size and unit cell size. For layered materials, Grazing Incidence XRD (GIXRD) allows compositional depth profiling of phases within the structure.
96-cell microplate reader
SEM provides detailed high-resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal.
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